ISSN 0004-881X

Application of Secondary Ion Mass Spectrometry in Studies of Niobium Segregation in Niobium-Doped Titanium Dioxide

by L.R. Sheppard*, A.J. Atanacio2, T. Bak1, J. Nowotny1, and K.E. Prince2
1 Centre for Materials Research in Energy Conversion, School of Materials Science and Engineering, University of New, South Wales, 2052, Australia
2 Institute for Environmental Research, Australian Nuclear Science and Technology Organisation, Lucas Heights, 2234, Australia

Abstract

Secondary ion mass spectrometry (SIMS) is a powerful technique in the study of materials that demonstrate compositional changes as a function of depth from the surface. This is due to the high chemical sensitivity of SIMS (sensitive to ppb) and potential for high depth resolution. However, as a semi-quantitative technique, the application of SIMS to quantitative studies can be problematic without knowledge of the appropriate calibration information, which must be obtained through the use of carefully prepared reference specimens. In the present work, SIMS is used in the investigation of surface segregation in niobium doped polycrystalline TiO2. This material has demonstrated important photo-catalytic properties with implications for alternative energy generation and environmentally-friendly water purification, but requires investigation in relation to surface versus bulk processing. The present paper demonstrates the use of SIMS in the quantitatively assessment of segregation in TiO2 and the development of a calibration curve.

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